Project Porth Semi Conductor Laboratory Layers of Protection Analysis (LOPA)

Project Porth Semi Conductor Laboratory Layers of Protection Analysis (LOPA)

About The Project

The client plans to build a new Research and Development (R&D) laboratory and manufacturing facility for semiconductors to meet increased demand.

Scope of Work

To address potential risks and hazards associated with the project during the RIBA 4 phase of the project, Process Risk Consulting were commissioned to conduct the Safety Integrity Level (SIL) Allocation study using the Layers of Protection Analysis (LOPA) methodology for the Safety Instrumented Functions (SIF’s) used as part of the manufacturing process of the semiconductors.

Project Details

  • user KLA
  • 2023
  • layers-filled Layers of Protection Analysis, Safety Integrity Level (SIL) Allocation
  • tag_fill_round [#1176] Created with Sketch. LOPA

Need Safety Support?

Contact us to see how we can help you on your next project.

Contact Us
Back to top